发明名称 |
ADVANCED INSPECTION METHOD UTILIZING SHORT PULSES LED ILLUMINATION |
摘要 |
<p>:An illumination module that may include a LED driver; a strip cable comprising multiple conductors that have a high ratio form factor and a low impedance and a low inductance factor; the forms factor is a ratio between a width of the strip cable and a thickness of the strip cable; a group of light emitting diodes (LEDs) that comprises at least one IFD; the group of LED is coupled to the LED driver via the strip cable; wherein the LED driver is arranged to activate the group of LEDs by driving a high current short duration driving signal via the strip cable; and wherein the group of LEDs is arranged to emit at least one light pulse in response to the high current short duration driving signal.(Figure 18)</p> |
申请公布号 |
SG176389(A1) |
申请公布日期 |
2011.12.29 |
申请号 |
SG20110036795 |
申请日期 |
2011.05.23 |
申请人 |
CAMTEK LTD. |
发明人 |
AMNON MENACHEM;YOSSI CHERBIS;ARNON BEN NATAN, KIRYAT TIVON, IL |
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