| 摘要 |
A microscopy image, formed by illuminating a sample by shining light onto it in an illumination direction and capturing scattered light, is used to produce an enhanced image. This is done using an expression which links the intensity of the portions of the image to respective values of a scattering parameter at multiple respective elements of the sample. The scattering parameter may be an emission coefficientρem or else equal to an absorption coefficientραb. This expression is solved to find the values of the scattering parameter. The scattering parameter is used to construct an enhanced image, for example an image which maps the variation of the scattering parameter itself. Provided the scattering parameter is found accurately, the enhanced image should be less subject than the original image to degradation due to non-uniform light attenuation and scattering.
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