发明名称 Methods for operating a semiconductor device
摘要 A capacitorless memory device based on a multi-gate MOSFET and requiring relatively low bias voltages. By providing a sufficient body factor and inducing a V T -feedback loop, using an accumulation layer to link threshold voltage with gate-to-body voltage, a hysteresis window (H) can be induced allowing the MOSFET to store '1' or '0' values (54, 51), and to read (within a program window PW) and hold (50) the stored values. The device operates with relatively low operating voltages such as 1.5V, high reliability e.g. 10 16 operations, and long retention time such as ~5sec.
申请公布号 EP2400498(A1) 申请公布日期 2011.12.28
申请号 EP20110171351 申请日期 2011.06.24
申请人 IMEC 发明人 LU, ZHICHAO;COLLAERT, NADINE;AOULAICHE, MARC;JURCZAK, MALGORZATA
分类号 H01L29/78;G11C11/404 主分类号 H01L29/78
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