发明名称
摘要 <P>PROBLEM TO BE SOLVED: To provide a pattern forming method in which, in an immersion lithography process applying a protective film, a resist film surface is wetted with a 4-10C higher alcohol before coating with the protective film, so that the migration of resist additives to the protective film can be prevented to minimize a change in pattern profile, and the resist film surface is hydrophilized by slight surface roughing by the alcohol treatment to prevent the occurrence of blob defects and to reduce a dispense amount in coating with the protective film. <P>SOLUTION: The pattern forming method includes: a process of applying a photoresist material on a substrate; a process of wetting a formed photoresist film surface after heat treatment with a solution containing a 4-10C higher alcohol, and exposing the surface with a high energy line after coating with a protective film and heat treatment; and a process of performing development with a developer. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP4844756(B2) 申请公布日期 2011.12.28
申请号 JP20070286954 申请日期 2007.11.05
申请人 发明人
分类号 G03F7/11;C08F20/28;G03F7/38;H01L21/027 主分类号 G03F7/11
代理机构 代理人
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