发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 A semiconductor device manufacturing method includes forming an insulation film containing silicon, oxygen and carbon over a semiconductor substrate by chemical vapor deposition; making UV cure on the insulation film being heated at a temperature of 350° C. or below after the forming the insulation film; and making helium plasma processing on the insulation film after the UV cure.
申请公布号 US2011312191(A1) 申请公布日期 2011.12.22
申请号 US201113070740 申请日期 2011.03.24
申请人 FUJITSU SEMICONDUCTOR LIMITED 发明人 OHKURA YOSHIYUKI;MORI TOSHIKI
分类号 H01L21/31 主分类号 H01L21/31
代理机构 代理人
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