摘要 |
<p>Disclosed are embodiments of an improved transistor structure (100) (e.g., a bipolar transistor (BT) structure or heterojunction bipolar transistor (HBT) structure) and a method of forming the transistor structure (100). The structure embodiments can incorporate a dielectric layer (130) sandwiched between an intrinsic base layer (120) and a raised extrinsic base layer (140) to reduce collector-base capacitance Ccb, a sidewall-defined conductive strap (150) for an intrinsic base layer (120) to extrinsic base layer (140) link-up region to reduce base resistance Rb and a dielectric spacer (160) between the extrinsic base layer (140) and an emitter layer (180) to reduce base- emitter Cbe capacitance. The method embodiments allow for self-aligning of the emitter to base regions and further allow the geometries of different features (e.g., the thickness of the dielectric layer (130), the width of the conductive strap (150), the width of the dielectric spacer (160) and the width of the emitter layer (180)) to be selectively adjusted in order to optimize transistor performance.</p> |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION;CAMILLO-CASTILLO, RENATA;DAHLSTROM, MATTIAS, E.;GRAY, PETER, B.;HARAME, DAVID, L.;HERRIN, RUSSELL, T.;JOSEPH, ALVIN, J.;STRICKER, ANDREAS, D. |
发明人 |
CAMILLO-CASTILLO, RENATA;DAHLSTROM, MATTIAS, E.;GRAY, PETER, B.;HARAME, DAVID, L.;HERRIN, RUSSELL, T.;JOSEPH, ALVIN, J.;STRICKER, ANDREAS, D. |