发明名称 POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN
摘要 <p>PURPOSE: A positive type resist composition and a method for forming a resist pattern are provided to improve the lithographic characteristic, pattern shapes, the resolution, and the contrast of the composition. CONSTITUTION: A positive type resist composition includes a base component(A'). The dissolution of the A' with respect to an alkali developing solution is increase by the action of acid. The A' contains a resin component(A1) with a structural unit(a0-1) and a structural unit(a1). The a0-1 is represented by chemical formula 1. The a1 contains an acid-labile dissolution suppressing group. In the chemical formula 1, the R1 is hydrogen atom, C1 to C5 alkyl group, or C1 to C5 halogenated alkyl group. The R2 is single bond or divalent coupling agent. The R3 is cyclic group containing -SO_2-.</p>
申请公布号 KR20110136716(A) 申请公布日期 2011.12.21
申请号 KR20110055974 申请日期 2011.06.10
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 SUZUKI KENTA;SHIONO DAIJU
分类号 G03F7/039;G03F7/004;H01L21/027 主分类号 G03F7/039
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