| 摘要 |
A fault coverage calculating apparatus includes: an extraction module configured to extract information on a pair of wiring lines including a length of the pair adjacent within a predetermined distance range and a distance between the pair and bridge fault information corresponding to the pair from layout information of a semiconductor integrated circuit; a test module configured to perform a determination test for determining whether a bridge fault occurring in the pair is detected by using a bridge fault test pattern of a target; and a calculation module configured to calculate a bridge fault coverage to which the length and the distance are weighted, based on the information on the pair of wiring lines, the bridge fault information, a result of the determination test, and a bridge fault incidence depending on the distance. |
