APPARATUS FOR MONITORING THE STATE OF THE TIP OF A PLASMA CUTTING DEVICE

摘要

The present invention relates to an apparatus for monitoring the state of the tip of a plasma cutting device (PCD). The apparatus for monitoring the state of a tip of the present invention is an apparatus for monitoring the state of a PCD tip attached to the PCD torch of a plasma cutting device (PCD), comprising: a control module for monitoring the state of the PCD tip; an elastic-wave detecting sensor; a detection signal receiving module; a cutting process conditions receiving module; a processing conditions package data extraction module; a PCD tip state assessment criteria information extraction module; a PCD-tip-state first assessment module; and a PCD-tip-state first response module.