发明名称 METHOD FOR DEPOSITING TUNGSTEN LAYERS USING SEQUENTIAL FLOW DEPOSITION
摘要 <p>A method for depositing metal layers with good surface morphology using sequential flow deposition includes alternately exposing a substrate in a process chamber to a metal-carbonyl precursor gas and a reducing gas. During exposure with the metal-carbonyl precursor gas, a thin metal layer is deposited on the substrate, and subsequent exposure of the metal layer to the reducing gas aids in the removal of reaction by-products from the metal layer. The metal-carbonyl precursor gas and a reducing gas exposure steps can be repeated until a metal layer with a desired thickness is achieved. The metal-carbonyl precursor can, for example, be selected from W(CO)6, Ni(CO)4, Mo(CO)6, Co2(CO)8, Rh4(CO)12, Re2(CO)10, Cr(CO)6, and Ru3(CO)12.</p>
申请公布号 KR20110134524(A) 申请公布日期 2011.12.14
申请号 KR20117028190 申请日期 2004.09.07
申请人 TOKYO ELECTRON LIMITED;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 MATSUDA TSUKASA;IKEDA TARO;HATANO TATSUO;TACHIBANA MITSUHIRO;YAMASAKI HIDEAKI;LEUSINK GERT J.;MCFEELY FENTON R.;MALHOTRA SANDRA G.;SIMON ANDREW H.;YURKAS JOHN J.
分类号 H01L21/285;C23C16/16;C23C16/44;C23C16/455;H01L21/20 主分类号 H01L21/285
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