发明名称 SEQUENCE TEST DEVICE AND SEQUENCE TEST METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a sequence test device and a sequence test method capable of easily specifying log information beyond the range of expectations. <P>SOLUTION: A sequence test device 40 comprises: a reference scenario registration unit 41 for registering a reference scenario; a threshold setting unit 43 for setting a threshold of response time for each sequence defined in the reference scenario; a log information acquisition unit 45 for acquiring log information between a node A10, a node B20 and a node C30; a comparison unit 47 for comparing the response time of a predetermined sequence included in the log information with the range of expectations, which is a time range obtained by adding the response time included in the reference scenario and the threshold of the response time; and a display unit 48 for, by inputting comparison result data from the comparison unit 47, displaying in a distinguishable manner the log information related to a response message sent within the range of expectations and the log information related to a response message sent beyond the range of expectations. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011250104(A) 申请公布日期 2011.12.08
申请号 JP20100120747 申请日期 2010.05.26
申请人 ANRITSU CORP 发明人 IKETANI TOMOHITO
分类号 H04W88/02;H04B17/00;H04M1/24 主分类号 H04W88/02
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