SOLID-STATE IMAGING DEVICE, SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, CAMERA, AND SIGNAL PROCESSING METHOD

摘要

PROBLEM TO BE SOLVED: To provide a solid-state imaging device and the like having an AD conversion part that can lower a linearity error and a differential linearity error in AD conversion and keep the data continuity.

SOLUTION: A solid-state imaging device has an imaging part 10, an AD conversion part 70 that converts a picture element signal from the imaging part 10 into a digital signal, and a calibration part 100 that carries out calibration to the AD conversion part 70. The AD conversion part 70 has a reference voltage generation part 40 that generates a plurality of reference voltages, an upper bit conversion part 20 that specifies a voltage section including the picture element signal among the plurality of voltage sections in which each of the reference voltages is defined as a base point, and a lower bit conversion part 30 that converts a difference voltage between the reference voltage which is the base point of the specified voltage section and the picture element signal into the digital signal. The calibration part 100 carries out calibration of the plurality of reference voltages in the plurality of voltage sections in which each reference voltage is defined as the base point, using a plurality of horizontal scanning periods at the beginning of the frame.

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