发明名称 Charged particle beam alignment method and charged particle beam apparatus
摘要 <p>An object of the present invention is to provide a charged particle beam apparatus and an alignment method of the charged particle beam apparatus, which make it possible to align an optical axis of a charged particle beam easily even when a state of the charged particle beam changes. The present invention comprises calculation means for calculating a deflection amount of an alignment deflector which performs an axis alignment for an objective lens, a plurality of calculation methods for calculating the deflection amount is memorized in the calculation means, and a selection means for selecting at least one of the calculation methods is provided. </p>
申请公布号 EP2309530(A3) 申请公布日期 2011.12.07
申请号 EP20100012302 申请日期 2002.05.21
申请人 HITACHI, LTD. 发明人 SATO, MITSUGU;OTAKA, TADASHI;EZUMI, MAKOTO;TAKANE, ATSUSHI;YOSHIDA, SHOJI;YAMAGUCHI, SATORU;OZAWA, YASUHIKO
分类号 H01J37/147;H01J37/28 主分类号 H01J37/147
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