| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method capable of accurately measuring an electron multiplication factor. <P>SOLUTION: An electron multiplication imaging apparatus 1 equipped with a solid-state imaging device 10 acquires a first multiplication image by incident light of a first light quantity and a second multiplication image by incident light of a second light quantity, at a preset predetermined electron multiplication factor, and calculates a luminance average value and a luminance dispersion average value of a pixel included in the first multiplication image and a luminance average value and a luminance dispersion average value of a pixel included in the second multiplication image. The electron multiplication imaging apparatus 1 then calculates conversion coefficients of the first and second multiplication images using the calculated luminance average values and luminance dispersion average values and calculates an actual electron multiplication factor of the solid-state imaging device 10 using the calculated conversion coefficients and a conversion coefficient based on a reference electron magnification factor to be retained in advance. <P>COPYRIGHT: (C)2012,JPO&INPIT |
