发明名称 ORBITAL ANALYSIS DEVICE AND ORBITAL ANALYSIS METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide an orbital analysis device and an orbital analysis method which are capable of accurately detecting minute movements as well as large movements. <P>SOLUTION: The orbital analysis device includes: an attitude detector including an attitude detection part fixed to an object and including an inertial sensor provided with an angular speed sensor and at least two acceleration sensors, a data I/F part for amplification and A/D conversion of detection data, an operation part for processing data, a sensor control part for selecting one of the acceleration sensors on the basis of the operation result, and an attitude data generation part for generating attitude data from output data from the inertial sensor including the selected acceleration sensor and sending the attitude data; an analyzer including an analysis part for analyzing the attitude data from the attitude detection part, a storage part for storing the attitude data and the analysis result, and a notification part for notifying of the analysis result; and a communication means for communication between the attitude detector device and the analyzer. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011242323(A) 申请公布日期 2011.12.01
申请号 JP20100116088 申请日期 2010.05.20
申请人 SEIKO EPSON CORP 发明人 SAEKI KENJI;SATO MASATOSHI;MIZUTA KAZUMASA
分类号 G01B21/00;A63B69/38;G01P13/00 主分类号 G01B21/00
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