发明名称 TUNNEL MAGNETORESISTANCE EFFECT ELEMENT, AND MAGNETIC MEMORY CELL AND MAGNETIC RANDOM ACCESS MEMORY EMPLOYING SAME
摘要 <p>Disclosed is a tunnel magnetoresistance effect element that is capable, with a simple configuration suited to large volume applications, of achieving adequate thermal stability (E/kT) without increased power consumption, as well as a nonvolatile magnetic memory cell and a magnetic random access memory employing same. In a tunnel magnetoresistance effect element (400), a structure is connected in an array with a magnetoresistance effect detector unit (410) that includes a ferromagnetic recording layer (406); said structure having a field magnetization control layer (409), which denotes antiferromagnetism, which can be controlled by an electric field in a magnetism direction, and which is mutually coupled with a first ferromagnetic layer (408). An effective magnetic field is impressed upon the ferromagnetic recording layer (406) by the first ferromagnetic layer (408). The tunnel magnetoresistance effect element is applied to a magnetic memory cell and a magnetic random access memory.</p>
申请公布号 WO2011145146(A1) 申请公布日期 2011.11.24
申请号 WO2010JP03397 申请日期 2010.05.20
申请人 HITACHI, LTD.;YAMANOUCHI, MICHIHIKO;KUROSAKI, YOSUKE;HAYAKAWA, JUN;TAKAHASHI, HIROMASA 发明人 YAMANOUCHI, MICHIHIKO;KUROSAKI, YOSUKE;HAYAKAWA, JUN;TAKAHASHI, HIROMASA
分类号 H01L43/10;H01L21/8246;H01L27/105;H01L43/08 主分类号 H01L43/10
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