发明名称 |
METHOD FOR MEASURING SYSTEM PARAMETER OF LINEAR MULTIPORT AND MEASURING METHOD USING VECTOR NETWORK ANALYZER |
摘要 |
The present invention provides a novel measurement method for system parameters of a 5-port junction used in a VNA (Vector Network Analyzer). A VNA is a device for measuring amplitude ratios and phase differences (S-parameters: scattering matrix elements) between incident waves and reflected waves of a DUT (Device Under Test), or between input waves and transmitted waves. What has been newly discovered is that for 5 ports, S-parameters can be expressed by a linear coupling using H and power difference ratios ({P(S)/P(0)}−1). It is possible to easily calculate parameter H using a minimum of three already known standards, and amount of calculation can be reduced compared to conventionally.
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申请公布号 |
US2011288800(A1) |
申请公布日期 |
2011.11.24 |
申请号 |
US201013147575 |
申请日期 |
2010.02.02 |
申请人 |
CAMPUS CREATE CO., LTD.;THE UNIVERSITY OF ELECTRO-COMMUNICATIONS |
发明人 |
KONDO HAJIME;YAKABE TOSHIYUKI;YABE HATSUO |
分类号 |
G01R27/28;G06F19/00 |
主分类号 |
G01R27/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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