| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a flaw evaluation device with which the developing duration of a flaw generated in a component can be adequately evaluated. <P>SOLUTION: A flaw evaluation device has a first memory part for storing corresponding data showing the shape of components of a weld zone and a temporal change of operation cycles and a second memory part for storing flaw condition data showing a flaw generated in the components and calculates the development amount of a crack due to exhaustion and creep based on the corresponding data and flaw condition data and evaluates the flaw duration life of the weld zone based on the developing amount of the crack. <P>COPYRIGHT: (C)2012,JPO&INPIT |
