发明名称 IMAGE INSPECTION METHOD AND IMAGE INSPECTION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To perform an inspection in consideration of a distribution of a normal product group concerning an image inspection method and an image inspection device for inspecting a quality of an image of an inspected product by using a mahalanobis distance. <P>SOLUTION: A computer acquires the images of multiple normal products in a normal appearance state respectively as candidate images of reference images to be reference for determining the qualities of the images of the inspected products (S31). Prescribed feature amounts are extracted from each candidate image (S32). The multiple candidate images are classified based on the extracted feature amounts (S33). A part of the candidate images is selected as a reference image group, based on the distribution of the classified candidate images (S34). A reference space constituted of the Mahalanobis distance is generated based on the selected reference image group, so as to determine a threshold for quality determination in the images of the inspected products (S35, A36). <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011232302(A) 申请公布日期 2011.11.17
申请号 JP20100105593 申请日期 2010.04.30
申请人 RICOH ELEMEX CORP 发明人 MIZUNO NAOKI
分类号 G01N21/88 主分类号 G01N21/88
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