| 摘要 |
<P>PROBLEM TO BE SOLVED: To achieve a coating pattern size measurement apparatus for which the influence of path line variation can be minimized and which can flexibly cope with the coating pattern and be downsized. <P>SOLUTION: In a coating pattern size measurement apparatus in which the size of the coating pattern obtained by coating or printing of a coating material on a sheet substrate running in the convey direction is measured by a optical reading means which optically photographs the difference of a reflection rate of the coating part and the sheet substrate, the optical reading means includes a lens array in which a plurality of lenses are linearly arranged which are provided to be firmly close to the sheet substrate orthogonal to the convey direction and a one-dimensional imaging sensors arranged linearly at the imaging positions of the lens array. <P>COPYRIGHT: (C)2012,JPO&INPIT |
