| 摘要 |
<P>PROBLEM TO BE SOLVED: To realize a semiconductor testing device which can synchronize a high speed determination result data and Device Under Test(DUT) determination result data and display it. <P>SOLUTION: A test on a target device to be tested is conducted with pattern data of different speed, a low-speed pattern data and high-speed pattern data. A low speed determination result data and high speed determination result data are acquired according to an output signal from the target device to be tested. The semiconductor testing device displaying the high speed determination result data and DUT determination result data which is a logical disjunction of the low speed determination result data and high speed determination result data, on a display part comprises: a fail control part which counts the number of fails included in the high speed determination result data for each cycle of a low speed delimiting signal indicating a delimitation of the low speed pattern data, and stores a count value; and a calculation control part which synchronizes the high speed determination result data with the DUT determination result data according to the count value and displays it on the display part. <P>COPYRIGHT: (C)2012,JPO&INPIT |
