发明名称 PROCESS KIT SHIELD FOR IMPROVED PARTICLE REDUCTION
摘要 Apparatus for improved particle reduction are provided herein. In some embodiments, an apparatus may include a process kit shield comprising a one-piece metal body having an upper portion and a lower portion and having an opening disposed through the one-piece metal body, wherein the upper portion includes an opening-facing surface configured to be disposed about and spaced apart from a target of a physical vapor deposition chamber and wherein the opening-facing surface is configured to limit particle deposition on an upper surface of the upper portion of the one-piece metal body during sputtering of a target material from the target of the physical vapor deposition chamber.
申请公布号 US2011278165(A1) 申请公布日期 2011.11.17
申请号 US201113106392 申请日期 2011.05.12
申请人 RASHEED MUHAMMAD;WANG RONGJUN;LIU ZHENDONG;FU XINYU;TANG XIANMIN;APPLIED MATERIALS, INC. 发明人 RASHEED MUHAMMAD;WANG RONGJUN;LIU ZHENDONG;FU XINYU;TANG XIANMIN
分类号 C23C14/04 主分类号 C23C14/04
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