发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To operate a transistor faster at higher speed. <P>SOLUTION: InGaAs is selectively etched by wet etching using phosphoric acid and hydrogen peroxide in aqueous solution to pattern an n-InGaAs layer 102 to form a source contact layer (a first semiconductor layer) 112, and a side part of a channel layer 114 is etched to form a channel layer 114a whose width is narrowed. By this wet etching, the channel layer 114a having desired mesa width (for example, 15 nm) is formed. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011233617(A) 申请公布日期 2011.11.17
申请号 JP20100100797 申请日期 2010.04.26
申请人 NIPPON TELEGR & TELEPH CORP <NTT>;TOKYO INSTITUTE OF TECHNOLOGY 发明人 IDA MINORU;YAMAHATA SHOJI;SAITO NAOFUMI;MIYAMOTO YASUYUKI
分类号 H01L29/12;H01L21/331;H01L21/336;H01L29/737;H01L29/78 主分类号 H01L29/12
代理机构 代理人
主权项
地址