发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To operate a transistor faster at higher speed. <P>SOLUTION: InGaAs is selectively etched by wet etching using phosphoric acid and hydrogen peroxide in aqueous solution to pattern an n-InGaAs layer 102 to form a source contact layer (a first semiconductor layer) 112, and a side part of a channel layer 114 is etched to form a channel layer 114a whose width is narrowed. By this wet etching, the channel layer 114a having desired mesa width (for example, 15 nm) is formed. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2011233617(A) |
申请公布日期 |
2011.11.17 |
申请号 |
JP20100100797 |
申请日期 |
2010.04.26 |
申请人 |
NIPPON TELEGR & TELEPH CORP <NTT>;TOKYO INSTITUTE OF TECHNOLOGY |
发明人 |
IDA MINORU;YAMAHATA SHOJI;SAITO NAOFUMI;MIYAMOTO YASUYUKI |
分类号 |
H01L29/12;H01L21/331;H01L21/336;H01L29/737;H01L29/78 |
主分类号 |
H01L29/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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