发明名称 CHEMICAL-MECHANICAL PLANARIZATION PAD INCLUDING PATTERNED STRUCTURAL DOMAINS
摘要 An aspect of the present disclosure relates to a chemical mechanical planarization pad including a first domain and a second continuous domain wherein the first domain includes discrete elements regularly spaced within the second continuous domain. The pad may be formed by forming a plurality of openings for a first domain within a second continuous domain of the pad, wherein the openings are regularly spaced within the second domain, and forming the first domain within the plurality of openings in second continuous domain. In addition, the pad may be used in polishing a substrate with a polishing slurry.
申请公布号 KR20110124227(A) 申请公布日期 2011.11.16
申请号 KR20117018544 申请日期 2010.01.27
申请人 INNOPAD, INC. 发明人 LEFEVRE PAUL;MATHEW ANOOP;QIAO SCOTT XIN;WU GUANGWEI;WELLS DAVID ADAM;HSU OSCAR K.
分类号 H01L21/304 主分类号 H01L21/304
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