发明名称 PROBE BLOCK FOR EXAMINING DISPLAY PANEL AND PROBE UNIT INCLUDING THEREOR
摘要 PURPOSE: A probe block for inspecting a display panel inspection and a probe unit are provided to efficiently check a display panel in which a high density microelectrode is arranged. CONSTITUTION: A probe block(220) comprises a main body(222), a probe film(100), and a first plate(242). The main body includes an inclined protruded part. The probe film is combined with the bottom surface of the inclined protruded part, is projected to the end side of the inclined protruded part, is touched with the electrode of a display panel, and applies a signal. The first plate is combined with the upper surface of the inclined protruded part, is contacted with the upper side of the probe film which is projected and extended, and supports the probe film.
申请公布号 KR20110122900(A) 申请公布日期 2011.11.14
申请号 KR20100042231 申请日期 2010.05.06
申请人 DI PROBE COPORATION 发明人 AN, SUNG KWON;KIM, JANG HYUN
分类号 G01R1/073;G02F1/13 主分类号 G01R1/073
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