发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To establish a simpler inspection method with which no prober in wiring is required and to provide a inspection device using the inspection method. <P>SOLUTION: In an inspection method, electromotive force is generated in wiring of element substrate through electromagnetic induction, thereby conducting current in the wiring to perform inspection. Through application of voltage on the circuit or circuit elements in a noncontact manner, the circuit or circuit elements are operated. The voltage output by the circuit or circuit elements is read in a noncontact manner, thereby determining the quality of the circuit or circuit elements. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011227087(A) 申请公布日期 2011.11.10
申请号 JP20110125988 申请日期 2011.06.06
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 HIROKI MASAAKI
分类号 G01R31/302;H04N17/04 主分类号 G01R31/302
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