发明名称 SEMICONDUCTOR MEMORY DEVICE AND A METHOD OF MANUFACTURING THE SAME
摘要 A memory cell of an SRAM has two drive MISFETs and two vertical MISFETs. The p channel vertical MISFETs are formed above the n channel drive MISFETs. The vertical MISFETs respectively mainly include a laminate formed of a lower semiconductor layer, intermediate semiconductor layer and upper semiconductor layer laminated in this sequence, a gate insulating film of silicon oxide formed on the surface of the side wall of the laminate, and a gate electrode formed so as to cover the side wall of the laminate. The vertical MISFETs are perfect depletion type MISFETs.
申请公布号 US2011275207(A1) 申请公布日期 2011.11.10
申请号 US201113176196 申请日期 2011.07.05
申请人 MONIWA MASAHIRO;CHAKIHARA HIRAKU;OKUYAMA KOUSUKE;TAKAHASHI YASUHIKO 发明人 MONIWA MASAHIRO;CHAKIHARA HIRAKU;OKUYAMA KOUSUKE;TAKAHASHI YASUHIKO
分类号 H01L21/28;H01L27/088;G11C11/412;H01L21/8234;H01L21/8244;H01L27/11 主分类号 H01L21/28
代理机构 代理人
主权项
地址