发明名称 Method for recognition of rupture noise for monitoring automated production of silicon wafers for solar cell, involves dividing electrical signals into signal portions, and analyzing power density spectrum of each signal portion
摘要 <p>#CMT# #/CMT# The method involves receiving, by a microphone (1), acoustic waves, and providing electric signals to a function unit. The electrical signals are divided into signal portions such that signal portions partly overlap with each other. A power density spectrum of each signal portion is analyzed by a spectrum analyzer (6). The analyzed signal portions are high pass filtered with a high pass filter (9), and the filtered signal portions are integrated with integrators (11.1, 11.2). The integrated signal portions are provided to a signaling device (13) to output a signal indicating a rupture event. #CMT#USE : #/CMT# Method for recognition of rupture noise for monitoring automated production of silicon wafers for a solar cell in an industrial facility. Can also be used for monitoring rupture of window or door glasses in a building. #CMT#ADVANTAGE : #/CMT# The method enables rupture noise to be reliably and automatically identified and communicated to a safety device during processing of silicon wafers. #CMT#DESCRIPTION OF DRAWINGS : #/CMT# The drawing shows a block diagram of the function unit.'(Drawing includes non-English language text)' 1 : Microphone 6 : Spectrum analyzer 9 : High pass filter 11.1, 11.2 : Integrators 13 : Signaling device.</p>
申请公布号 DE102010019496(A1) 申请公布日期 2011.11.10
申请号 DE20101019496 申请日期 2010.05.06
申请人 ZIPSER, LOTHAR 发明人 ZIPSER, LOTHAR;HOHNDORF, GERT;PETER, ANDREAS
分类号 G08B13/04;G01H1/00;G01N29/04 主分类号 G08B13/04
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