发明名称 CIRCUIT FOR CONTROLLING TEMPERATURE AND ENABLING TESTING OF A SEMICONDUCTOR CHIP
摘要 A circuit (100) for controlling temperature of a semiconductor chip includes a first heating element (105 A) that is built into the semiconductor chip. The first heating element (105 A) generates heat to increase the temperature of the semiconductor chip. The chip also includes a temperature controller (110) that is coupled to the first heating element (105 A) and built into the semiconductor chip. The temperature controller (110) controls the temperature to enable testing of the semiconductor chip at a desired temperature.
申请公布号 WO2011140491(A2) 申请公布日期 2011.11.10
申请号 WO2011US35600 申请日期 2011.05.06
申请人 TEXAS INSTRUMENTS INCORPORATED;TEXAS INSTRUMENTS JAPAN LIMITED;KARNAD, RAVINDRA;PRASAD, SUDHEER;JONNAVITHULA, RAM, A 发明人 KARNAD, RAVINDRA;PRASAD, SUDHEER;JONNAVITHULA, RAM, A
分类号 G01R31/26 主分类号 G01R31/26
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