CIRCUT BOARD AND MEHTOD FOR TESTING COMPONENT BUILT IN THE CIRCUIT BOARD

摘要

Disclosed herein are a circuit board and a method for testing devices embedded inside the circuit board. The circuit board according to an embodiment of the present invention includes an active device that is embedded inside the circuit board and includes at least one connection terminal; a passive device of which one terminal is electrically connected to one of the connection terminals of the active device and the other terminal is electrically connected to a signal pad on a surface of the circuit board; and a test pad that is electrically connected to the one terminal of the passive device. According to the present invention, even when the active device and the passive device are embedded inside the board, it is possible to effectively test a connection state of each device, thereby making it possible to easily determine whether defects occur in the circuit board.