METHODS OF SURFACE MEASUREMENT AND MODIFICATION BY LOCAL-PROBE MICROSCOPY OPERATING IN CONTINUOUS CURVILINEAR MODE, LOCAL-PROBE MICROSCOPE AND DEVICE ENABLING THE IMPLEMENTATION OF SAID METHODS

摘要

The invention relates to methods of surface modification, to methods of measuring adhesion forces and various interaction forces (friction forces, adhesion forces) by means of local-probe microscopy operating in continuous "curvilinear" mode, and to a local-probe microscope and a device enabling the implementation of said methods.