发明名称 Beam quality in FIB systems
摘要 Applicants have found that the asymmetrical energy distribution of ions from an ion source allow chromatic aberration to be reduced by filtering ions in the low energy beam tail without significantly reducing processing time. A preferred embodiment includes within an ion beam column a filter that removes the low energy ions from the beam.
申请公布号 US8053725(B2) 申请公布日期 2011.11.08
申请号 US20090494024 申请日期 2009.06.29
申请人 FEI COMPANY 发明人 SCHWIND GREGORY A.;ORLOFF JONATHAN H.
分类号 H01J37/05;H01J37/147;H01J37/305 主分类号 H01J37/05
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