发明名称 Method and apparatus for measuring flaw height in ultrasonic tests
摘要 The measurement of a flaw height in a thick welded portion of a stainless steel specimen, which is difficult to perform by the TOFD method, can be conducted with more ease, with higher accuracy and in a shorter time than in the case of using tip echo techniques. In addition, it is possible to reduce variations in measurement results among individual inspectors. An ultrasonic wave 21 is launched by a transmitting probe 1 into a specimen 20 in a direction oblique to a flaw 24 to generate diffracted waves at the tip 25 of the flaw 24, then a diffracted wave 22 propagating upward directly from the flaw 24 and a diffracted wave 23 propagating upwardly of the flaw 24 after once reflected off the back 27 are received by a receiving probe 2 disposed above the flaw 24, and the height of the tip of the flaw 24 from the back 27 is measured from the propagation time difference between the received diffracted waves.
申请公布号 US8051717(B2) 申请公布日期 2011.11.08
申请号 US20050659144 申请日期 2005.07.06
申请人 CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY 发明人 FUKUTOMI HIROYUKI;LIN SHAN;OGATA TAKASHI
分类号 G01N29/04 主分类号 G01N29/04
代理机构 代理人
主权项
地址