发明名称 |
DETECTING APPARATUS OF SEMICONDUCTOR MEMORY APPARATUS |
摘要 |
PURPOSE: A detecting apparatus of a semiconductor memory apparatus is provided to help a user to easily analyze to solve a MRD fail by securing the generation of a plurality of column select signals. CONSTITUTION: In a detecting apparatus of a semiconductor memory apparatus, a normal activity determining unit(100) confirms the activation of a normal column signal and generates a normal confirmation signal. The repair activity determining unit(200) confirms the activation of a repair column select signal and generates a repair confirmation signal. A plurality of activity determining units(300) generate plural column active signal according to the normal confirmation signal and the repair confirmation signal. |
申请公布号 |
KR20110121148(A) |
申请公布日期 |
2011.11.07 |
申请号 |
KR20100040611 |
申请日期 |
2010.04.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, YOUNG PARK;LEE, JEONG WOO;SHIN, SANG HOON;KWON, YONG KEE |
分类号 |
G11C29/02;G11C7/12 |
主分类号 |
G11C29/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|