发明名称 DETECTING APPARATUS OF SEMICONDUCTOR MEMORY APPARATUS
摘要 PURPOSE: A detecting apparatus of a semiconductor memory apparatus is provided to help a user to easily analyze to solve a MRD fail by securing the generation of a plurality of column select signals. CONSTITUTION: In a detecting apparatus of a semiconductor memory apparatus, a normal activity determining unit(100) confirms the activation of a normal column signal and generates a normal confirmation signal. The repair activity determining unit(200) confirms the activation of a repair column select signal and generates a repair confirmation signal. A plurality of activity determining units(300) generate plural column active signal according to the normal confirmation signal and the repair confirmation signal.
申请公布号 KR20110121148(A) 申请公布日期 2011.11.07
申请号 KR20100040611 申请日期 2010.04.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, YOUNG PARK;LEE, JEONG WOO;SHIN, SANG HOON;KWON, YONG KEE
分类号 G11C29/02;G11C7/12 主分类号 G11C29/02
代理机构 代理人
主权项
地址