SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND METHOD OF INSPECTING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

摘要

PROBLEM TO BE SOLVED: To allow a terminal for inspection of a regulator circuit to be also used as another functional terminal.

SOLUTION: A load current application circuit applies a load current for inspection from a load current application terminal to a load circuit based on a switch route selection signal. A regulator circuit driving circuit includes plural switch circuits for controlling the amount of current to be supplied to the load circuit based on a gate control signal. A differential amplifier compares a reference voltage with a load power supply voltage output from the regulator circuit driving circuit. A gate control signal selecting circuit generates the gate control signal so that the load power supply voltage becomes a predetermined voltage and outputs the signal to the regulator circuit driving circuit based on the output of the differential amplifier. When the inspection is conducted, the gate control signal selecting circuit operates a predetermined switch circuit among the plural switch circuits based on the output of the differential amplifier and outputs a gate control signal for turning off the other switch circuits.

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