发明名称 A METHOD OF FABRICATING NANO-SCALED STRUCTURE WITH NON-UNIFORM ROUGHNESS
摘要 PURPOSE: A method for manufacturing a nano-scale structure is provided to prevent the damage of a substrate while non-uniform roughness is generated on the nano-scale structure based on impurities introduced in a polycrystalline silicon structure forming process. CONSTITUTION: A method for manufacturing a nano-scale structure includes the following: An oxide layer(20) is formed on the surface of a substrate(10). A polycrystalline silicon structure(11) is formed on the upper side of the oxide layer by introducing impurities. Non-uniform roughness(13) is formed on the polycrystalline silicon structure through an etching process. The substrate is a silicon wafer. The etching process is based on XeF_2. The impurities are nitrogen gas.
申请公布号 KR20110120675(A) 申请公布日期 2011.11.04
申请号 KR20100040196 申请日期 2010.04.29
申请人 SNU R&DB FOUNDATION 发明人 LEE, JUNG HOON;KIM, YUN HO;LEE, SUNG JUN
分类号 B82B3/00;C23F1/24 主分类号 B82B3/00
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