发明名称 |
A METHOD OF FABRICATING NANO-SCALED STRUCTURE WITH NON-UNIFORM ROUGHNESS |
摘要 |
PURPOSE: A method for manufacturing a nano-scale structure is provided to prevent the damage of a substrate while non-uniform roughness is generated on the nano-scale structure based on impurities introduced in a polycrystalline silicon structure forming process. CONSTITUTION: A method for manufacturing a nano-scale structure includes the following: An oxide layer(20) is formed on the surface of a substrate(10). A polycrystalline silicon structure(11) is formed on the upper side of the oxide layer by introducing impurities. Non-uniform roughness(13) is formed on the polycrystalline silicon structure through an etching process. The substrate is a silicon wafer. The etching process is based on XeF_2. The impurities are nitrogen gas.
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申请公布号 |
KR20110120675(A) |
申请公布日期 |
2011.11.04 |
申请号 |
KR20100040196 |
申请日期 |
2010.04.29 |
申请人 |
SNU R&DB FOUNDATION |
发明人 |
LEE, JUNG HOON;KIM, YUN HO;LEE, SUNG JUN |
分类号 |
B82B3/00;C23F1/24 |
主分类号 |
B82B3/00 |
代理机构 |
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主权项 |
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