发明名称 DEFORMATION MEASUREMENT METHOD AND APPARATUS
摘要 There is a situation in that, although a speckle interference optical system is effective for clarification of a process of deformation of a specimen, resolution is insufficient, and execution of a phase shift method for improving the resolution involves a costly apparatus. A phase shift image for an initial fringe pattern is acquired, and a phase variation between phase information on an initial image and a next image is derived by a phase shift method. After that, a phase shift image for the next image is computed by calculation based on the acquired information.
申请公布号 US2011268312(A1) 申请公布日期 2011.11.03
申请号 US201113090163 申请日期 2011.04.19
申请人 CANON KABUSHIKI KAISHA 发明人 IMAIZUMI YO
分类号 G06K9/00 主分类号 G06K9/00
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