发明名称 QUANTUM WELL MOSFET CHANNELS HAVING UNI-AXIAL STRAIN CAUSED BY METAL SOURCE/DRAINS, AND CONFORMAL REGROWTH SOURCE/DRAINS
摘要 Embodiments described include straining transistor quantum well (QW) channel regions with metal source/drains, and conformal regrowth source/drains to impart a uni-axial strain in a MOS channel region. Removed portions of a channel layer may be filled with a junction material having a lattice spacing different than that of the channel material to causes a uni-axial strain in the channel, in addition to a bi-axial strain caused in the channel layer by a top barrier layer and a bottom buffer layer of the quantum well.
申请公布号 EP2382652(A2) 申请公布日期 2011.11.02
申请号 EP20090837050 申请日期 2009.12.23
申请人 INTEL CORPORATION 发明人 HUDAIT, MANTU;PILLARISETTY, RAVI;RADOSAVLJEVIC, MARKO;DEWY, GILBERT;RAKSHIT, TITASH;KAVALIEROS, JACK;TSAI, WILMAN;MAJHI, PRASHANT
分类号 H01L21/336;H01L21/285;H01L21/768;H01L29/165;H01L29/417;H01L29/778;H01L29/78 主分类号 H01L21/336
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