发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME |
摘要 |
PURPOSE: A semiconductor device and a forming method thereof are provided to improve the properties of a semiconductor device by increasing an overlay margin between a storage electrode contact plug and a storage electrode. CONSTITUTION: A gate(106) is formed on a semiconductor substrate(100) including an active area(104). A first spacer(108) is formed on the sidewall of the gate. A first storage electrode contact plug(114) is formed on the lower side of the sidewall of the first spacer. A second spacer(116) is formed on the upper side of the first storage electrode contact plug. A second storage electrode contact plug(118) is formed on the upper side of the first storage electrode contact plug. |
申请公布号 |
KR20110119051(A) |
申请公布日期 |
2011.11.02 |
申请号 |
KR20100038526 |
申请日期 |
2010.04.26 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
HWANG, CHANG YOUN;KIM, DONG SAUK |
分类号 |
H01L21/28;H01L29/768 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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