发明名称 |
HIGH FREQUENCY ANALYSIS OF A DEVICE UNDER TEST |
摘要 |
<p>Analyzing a device under test (“DUT”) at higher frequencies. A phase shifter varies the phase of a standing wave on a transmission line coupled to the DUT. The standing wave magnitude is sampled at each of the phase shifts and one or more DUT characteristics are determined as a function of the sampled magnitudes and phase shifts. Further aspects include a related phase shifter comprising a waveguide having a plurality of sub-resonant slots formed therein and having active elements for loading the slots to control the phase shift applied to the signal.</p> |
申请公布号 |
EP2382479(A1) |
申请公布日期 |
2011.11.02 |
申请号 |
EP20100731998 |
申请日期 |
2010.01.12 |
申请人 |
THE CURATORS OF THE UNIVERSITY OF MISSOURI |
发明人 |
ABOUKHOUSA, MOHAMED AHMED;ZOUGHI, REZA;KHARKIVSKIY, SERGIY |
分类号 |
G01R23/20;G01R27/04;G01R27/32 |
主分类号 |
G01R23/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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