发明名称 HIGH FREQUENCY ANALYSIS OF A DEVICE UNDER TEST
摘要 <p>Analyzing a device under test (“DUT”) at higher frequencies. A phase shifter varies the phase of a standing wave on a transmission line coupled to the DUT. The standing wave magnitude is sampled at each of the phase shifts and one or more DUT characteristics are determined as a function of the sampled magnitudes and phase shifts. Further aspects include a related phase shifter comprising a waveguide having a plurality of sub-resonant slots formed therein and having active elements for loading the slots to control the phase shift applied to the signal.</p>
申请公布号 EP2382479(A1) 申请公布日期 2011.11.02
申请号 EP20100731998 申请日期 2010.01.12
申请人 THE CURATORS OF THE UNIVERSITY OF MISSOURI 发明人 ABOUKHOUSA, MOHAMED AHMED;ZOUGHI, REZA;KHARKIVSKIY, SERGIY
分类号 G01R23/20;G01R27/04;G01R27/32 主分类号 G01R23/20
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