| 摘要 |
<p>The invention relates to a device for three-dimensionally measuring an object, comprising a first projection device having a first infrared light source for projecting a displaceable first pattern onto the object, and at least one image recording device for recording images of the object in an infrared spectral range. The invention further relates to a method for three-dimensionally measuring an object, comprising the steps of: projecting a first infrared pattern onto the object using a first projection device having a first infrared light source; and recording images of the object using at least one image recording device sensitive to infrared radiation; wherein the pattern is shifted between image captures.</p> |
