DEVICE FOR MEASURING THE THRESHOLD THICKNESS OF A LAYER OF PURELY RESISTIVE MATERIAL, MEASURING METHOD, METHOD FOR DIMENSIONING SUCH DEVICE, AND USE OF SUCH DEVICE IN AN EXHAUST PIPE

摘要

The invention relates to a simple, reliable, precise and economical device for detecting the threshold thickness of a deposit. The invention also relates to a device for measuring the threshold thickness of a layer of a purely resistive material, including a sensor with at least three electrodes (100a, 100b, 200a, 200b) for defining at least two electrode pairs (100, 200), each pair being arranged along a main longitudinal direction (DL) on the surface of a substrate (1). Each electrode includes a sub-electrode (100a-100b, 200a-200b) connected to a voltage source (2) through connections (10), and a means for measuring the resistances or intensities among the electrode pairs. The connections (10) are provided on the same surface of the substrate as the electrodes, laterally and substantially perpendicular relative to said electrodes. The electrode pairs differ from each other by at least a first parameter selected from the width and the spacing of the sub-electrodes, and a second parameter selected from the spacing, the width, the length and the adjustment of the sub-electrode supply voltage source, the second parameter being such that, during use, the resistance or intensity equality is obtained when the threshold thickness to be detected is deposited on the electrodes.