发明名称 Microlithography projection system with an accessible aperture stop
摘要 <p>The invention relates to a Microlithography projection system for imaging an object field in an object plane (100) onto an image field in an image plane (102) with a wavelength », wherein the microlithography projection system is a catoptric projection system comprising at least one intermediate image (Z1) of the object and an aperture stop (B) in the optical path of a beam of light from the object plane (100) to the image plane (102), wherein the aperture stop (B) in the optical path is arranged downstream the at least one intermediate image (Z1).</p>
申请公布号 EP2192446(B1) 申请公布日期 2011.10.19
申请号 EP20100002198 申请日期 2006.03.04
申请人 CARL ZEISS SMT GMBH 发明人 MANN, HANS-JUERGEN
分类号 G03F7/20 主分类号 G03F7/20
代理机构 代理人
主权项
地址