发明名称 Method for Optical Proximity Correction of a Reticle to be Manufactured Using Variable Shaped Beam Lithography
摘要 A method for optical proximity correction (OPC) of a desired pattern for a substrate is disclosed in which a plurality of variable shaped beam (VSB) shots are determined which can form on a surface an OPC-corrected version of the desired substrate pattern. Shots within the plurality of VSB shots are allowed to overlap each other. Dosages of the shots may also be allowed to vary with respect to each other. The union of the plurality of shots may deviate from the OPC-corrected version of the desired pattern for the substrate. In some embodiments, optimization may be used to minimize shot count. In other embodiments, the plurality of shots may be optionally selected from one or more pre-computed VSB shots or groups of VSB shots, that is, glyphs. A method for creating glyphs is also disclosed, in which patterns that would result on a surface from one or a group of VSB shots are pre-calculated.
申请公布号 US2011252386(A1) 申请公布日期 2011.10.13
申请号 US201113161487 申请日期 2011.06.15
申请人 D2S, INC. 发明人 FUJIMURA AKIRA;GLASSER LANCE
分类号 G06F17/50 主分类号 G06F17/50
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