发明名称 MARKING SIGNAL CONTROL METHOD FOR PRINTED MATTER DEFECT INSPECTION
摘要 PROBLEM TO BE SOLVED: To provide a marking signal control method for printed matter defect inspection, which allows setting of a printed matter defect inspection device and a marking device without limitation in the distance between both, and further allows suppression of use of resources in a memory or register by performing output control of marking signal relative to defect detection signal in defect inspection of printed matter.SOLUTION: In the marking signal control method for printed matter defect inspection, defect detection signal is written to an FIFO memory in order according to a state of write control signal, the defect detection signal is read from the FIFO memory in order according to a state of read control signal to output the marking signal to the marking device, and a waiting distance from the printed matter defect inspection device to the marking device which outputs the marking signal is preliminarily set, whereby the distance between the printed matter defect inspection device and the marking device is variable.
申请公布号 JP2011201027(A) 申请公布日期 2011.10.13
申请号 JP20100067725 申请日期 2010.03.24
申请人 TOPPAN PRINTING CO LTD 发明人 CHOI HAE YONG
分类号 B41F33/00;B41F33/14;B41F33/16 主分类号 B41F33/00
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