发明名称 METHOD OF FORMING MICROCRYSTALLINE SEMICONDUCTOR FILM AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of forming a microcrystalline semiconductor film with high crystallinity and a method of manufacturing with a high-productivity semiconductor device with favorable electrical characteristics.SOLUTION: After a first microcrystalline semiconductor film is formed on a substrate, the surface of the first microcrystalline semiconductor film is flattened, and then, an amorphous semiconductor region on the surface side of the flattened first microcrystalline semiconductor film is removed and a second microcrystalline semiconductor film with high crystallinity and having flatness is formed. Next, a third microcrystalline semiconductor film is formed on the second microcrystalline semiconductor film.
申请公布号 JP2011205077(A) 申请公布日期 2011.10.13
申请号 JP20110040297 申请日期 2011.02.25
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 TANAKA TETSUHIRO;YOKOI TOMOKAZU;ORIKI KOJI
分类号 H01L21/205;H01L21/336;H01L29/786;H01L51/50;H05B33/10;H05B33/14 主分类号 H01L21/205
代理机构 代理人
主权项
地址