发明名称 IMPACT TESTING DEVICE AND IMPACT TESTING METHOD USING THE SAME
摘要 An impact testing device for a test subject includes a supporting member, a suspending arm with an end fixed on the supporting member, and the other end of the suspending arm being a free end, and a fixing mechanism fixed on the suspending arm adjacent to the free end of the suspending arm to fix the test subject.
申请公布号 US2011247393(A1) 申请公布日期 2011.10.13
申请号 US20100873218 申请日期 2010.08.31
申请人 HON HAI PRECISION INDUSTRY CO., LTD. 发明人 CHIANG TSUNG-HSUN
分类号 G01N3/30 主分类号 G01N3/30
代理机构 代理人
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