发明名称 |
SEMICONDUCTOR DEVICE AND ELECTRONIC APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To solve the problem that a transistor suffers the variation caused in threshold voltage or mobility due to gathering of the factors of the variation in gate insulator film resulting from a difference in manufacture process or substrate used and of the variation in channel-region crystal state.SOLUTION: The invention relates to an electric circuit having an arrangement such that both electrodes of a capacitance element can hold a gate-to-source voltage of a particular transistor. The electric circuit has a function capable of setting a potential difference at between both the electrodes of the capacitance element by the use of a constant-current source. |
申请公布号 |
JP2011205699(A) |
申请公布日期 |
2011.10.13 |
申请号 |
JP20110148295 |
申请日期 |
2011.07.04 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
KIMURA HAJIME;SHIINA YASUKO |
分类号 |
H03F3/50 |
主分类号 |
H03F3/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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