发明名称 SEMICONDUCTOR DEVICE AND ELECTRONIC APPARATUS
摘要 PROBLEM TO BE SOLVED: To solve the problem that a transistor suffers the variation caused in threshold voltage or mobility due to gathering of the factors of the variation in gate insulator film resulting from a difference in manufacture process or substrate used and of the variation in channel-region crystal state.SOLUTION: The invention relates to an electric circuit having an arrangement such that both electrodes of a capacitance element can hold a gate-to-source voltage of a particular transistor. The electric circuit has a function capable of setting a potential difference at between both the electrodes of the capacitance element by the use of a constant-current source.
申请公布号 JP2011205699(A) 申请公布日期 2011.10.13
申请号 JP20110148295 申请日期 2011.07.04
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 KIMURA HAJIME;SHIINA YASUKO
分类号 H03F3/50 主分类号 H03F3/50
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