发明名称 Method for insulating film formation, storage medium from which information is readable with computer, and processing system
摘要 In order to form an insulating film, which constitutes a flat interface with silicon, by CVD, a surface of silicon is oxidized to form a silicon oxide film using a plasma treatment apparatus in which microwaves are introduced into a chamber through a flat antenna having a plurality of holes. A silicon oxide film is formed as an insulating film on the silicon oxide film by CVD. Further, in the plasma treatment apparatus, a treating gas containing a noble gas and oxygen is introduced into the chamber, and, further, microwaves are introduced into the chamber through the flat antenna. Plasma is generated under a pressure in the range of not less than 6.7 Pa and not more than 533 Pa to modify the insulating film with the plasma.
申请公布号 US8034179(B2) 申请公布日期 2011.10.11
申请号 US20090865969 申请日期 2009.02.06
申请人 TOKYO ELECTRON LIMITED 发明人 KABE YOSHIRO;KITAGAWA JUNICHI;YAMABE KIKUO
分类号 H01L21/31;H01L21/469 主分类号 H01L21/31
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