发明名称 Methods of forming recessed gate electrodes having covered layer interfaces
摘要 Methods of forming a gate electrode can be provided by forming a trench in a substrate, conformally forming a polysilicon layer to provide a polysilicon conformal layer in the trench defining a recess surrounded by the polysilicon conformal layer, wherein the polysilicon conformal layer is formed to extend upwardly from a surface of the substrate to have a protrusion and the protrusion has a vertical outer sidewall adjacent the surface of the substrate, forming a tungsten layer in the recess to form an upper surface that includes an interface between the polysilicon conformal layer and the tungsten layer, and forming a capping layer being in direct contact with top surfaces of the polysilicon conformal layer and the tungsten layer without any intervening layers.
申请公布号 US8034701(B2) 申请公布日期 2011.10.11
申请号 US20090533672 申请日期 2009.07.31
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE BYUNG-HAK;LEE CHANG-WON;PARK HEE-SOOK;SOHN WOONG-HEE;YOUN SUN-PIL;YOO JONG-RYEOL
分类号 H01L21/3205;H01L21/28;H01L21/336;H01L21/4763;H01L21/76;H01L21/8234;H01L21/8242;H01L27/148;H01L29/51;H01L29/768;H01L29/78 主分类号 H01L21/3205
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